NetForum uses cookies to ensure that we give you the best experience on our website. If you continue to use the site, we'll assume that you are happy to receive these cookies on the NetForum website. Read about our cookies.
NetForum Community
Learn. Share. Optimize.
Log in | Sign up now | Submit content | Contact
Go to similar content

Panorama 0.23T Lumbar spine

Wirtanen, Pirjo Philips Healthcare Philips Global

Login is required to download ExamCards.

ExamCard purpose

Typically on Panorama 0.23T a slice thickness of 5 mm is used. This ExamCard is optimized for routine lumbar examination with 4.0 mm slice thickness for all scans, except for the transverse T2w TSE that has 4.5 mm slice thickness. Imaging times are about 5 minutes.


In sagittal and coronal scans 4 mm slice thickness is possible but in the transverse T2w TSE a thickness of 4.5 mm is needed to achieve sufficient SNR and thus CNR levels.


Transverse T2w and T1w TSE can be scanned using one block or three stacks.

If you are using one block, change the position slot name accordingly, because in this ExamCard those have three-stack positioning. The transverse B-FFE3D block covers three disc spaces.


If you like to scan B-FFE3D in the sagittal plane, use a scan from Philips recommendation, that has originally 4 mm slice thickness.

ExamCard overview

Scan 13 plane Scout
Scan 2sag T2w TSE
Scan 3sag T1w TSE
Scan 4tra T2w TSE
Scan 5tra T1w TSE
Scan 6tra B-FFE3D

ExamCard images

Sagittal T2w TSE Sagittal T1w TSE
Sagittal T2w TSE
Sagittal T1w TSE
Transverse T2w TSE Transverse T1w TSE  Transverse B-FFE3D
Transverse T2w TSE
Transverse T1w TSE
Transverse B-FFE3D

This content has been made possible by NetForum Community.
Share this on: Share your link in twitter Share your link in facebook Share your link on LinkedIn Print Rate this article: Log in to vote

Mar 10, 2006

Rate this:
Log in to vote

Panorama 0.23T
Release 6
Lumbar spine, Neuro

Clinical News
Best Practices
Case Studies
Publications and Abstracts
White Papers
Web seminars and Presentations
Application Tips and FAQ
Try an Application
Business News
Case Studies
White Papers
Web Seminars and Presentations
Utilization Services
Contributing Professionals
Contributing Institutions
Become a Contributor